| |
| 2005 | ||
|---|---|---|
| 2 | EE | F. Palumbo, G. Condorelli, S. Lombardo, K. L. Pey, C. H. Tung, L. J. Tang: Structure of the oxide damage under progressive breakdown. Microelectronics Reliability 45(5-6): 845-848 (2005) |
| 1999 | ||
| 1 | EE | Eugenio Moggi, F. Palumbo: Monadic Encapsulation of Effects: a Revised Approach. Electr. Notes Theor. Comput. Sci. 26: (1999) |
| 1 | G. Condorelli | [2] |
| 2 | S. Lombardo | [2] |
| 3 | Eugenio Moggi | [1] |
| 4 | K. L. Pey | [2] |
| 5 | L. J. Tang | [2] |
| 6 | C. H. Tung | [2] |