| 2004 |
|---|
| 5 | EE | Yukio Okuda:
Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed?
ITC 2004: 1438 |
| 2003 |
|---|
| 4 | EE | Yukio Okuda,
Nobuyuki Furukawa:
Hysteresis of Intrinsic IDDQ Currents.
ITC 2003: 555-564 |
| 2002 |
|---|
| 3 | EE | Yukio Okuda:
Eigen-Signatures for Regularity-based IDDQ Testing.
VTS 2002: 289-294 |
| 2000 |
|---|
| 2 | | Yukio Okuda:
DECOUPLE: defect current detection in deep submicron I_DDQ.
ITC 2000: 199-206 |
| 1998 |
|---|
| 1 | EE | Yukio Okuda,
Isao Kubota,
Masahiro Watanabe:
Defect level prediction for I_DDQ testing.
ITC 1998: 900- |
