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Jochen Kolzer

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1991
2EEG. Antonin, H.-D. Oberle, Jochen Kolzer: Electrical Characterization of Megabit DRAMs, Part 1: External Testing. IEEE Design & Test of Computers 8(3): 36-43 (1991)
1EEJochen Kolzer, Johann Otto: Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing. IEEE Design & Test of Computers 8(4): 39-51 (1991)

Coauthor Index

1G. Antonin [2]
2H.-D. Oberle [2]
3Johann Otto [1]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)