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1991 | ||
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2 | EE | G. Antonin, H.-D. Oberle, Jochen Kolzer: Electrical Characterization of Megabit DRAMs, Part 1: External Testing. IEEE Design & Test of Computers 8(3): 36-43 (1991) |
1 | EE | Jochen Kolzer, Johann Otto: Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing. IEEE Design & Test of Computers 8(4): 39-51 (1991) |
1 | G. Antonin | [2] |
2 | H.-D. Oberle | [2] |
3 | Johann Otto | [1] |