| |
| 2005 | ||
|---|---|---|
| 2 | EE | Robert O'Connor, Greg Hughes, Robin Degraeve, Ben Kaczer: Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance. Microelectronics Reliability 45(5-6): 869-874 (2005) |
| 2003 | ||
| 1 | EE | Robert O'Connor, Sven van der Meer: Present and future organisational models for wireless networks. ISICT 2003: 157-162 |
| 1 | Robin Degraeve | [2] |
| 2 | Greg Hughes | [2] |
| 3 | Ben Kaczer | [2] |
| 4 | Sven van der Meer | [1] |