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| 2005 | ||
|---|---|---|
| 1 | EE | Robert O'Connor, Greg Hughes, Robin Degraeve, Ben Kaczer: Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance. Microelectronics Reliability 45(5-6): 869-874 (2005) |
| 1 | Robin Degraeve | [1] |
| 2 | Ben Kaczer | [1] |
| 3 | Robert O'Connor | [1] |