| |
| 2004 | ||
|---|---|---|
| 4 | EE | Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa: Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. J. Electronic Testing 20(1): 109-122 (2004) |
| 2001 | ||
| 3 | EE | Ondrej Novák, Jiri Nosek: Test Pattern Decompression Using a Scan Chain. DFT 2001: 110-115 |
| 2 | EE | Ondrej Novák, Jiri Nosek: Test-per-Clock Testing of the Circuits with Scan. IOLTW 2001: 90- |
| 2000 | ||
| 1 | EE | Ondrej Novák, Jiri Nosek: On Using Deterministic Test Sets in BIST. IOLTW 2000: 127-132 |
| 1 | Tomasz Garbolino | [4] |
| 2 | Krzysztof Gucwa | [4] |
| 3 | Andrzej Hlawiczka | [4] |
| 4 | Ondrej Novák | [1] [2] [3] [4] |
| 5 | Zdenek Plíva | [4] |