Hironobu Niijima

1996
3		Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima: Scan Design Oriented Test Technique for VLSI's Using ATE. ITC 1996: 453-460
1993
2		Kent Kwang, Hsin Wang, Arthur Hu, Mitsuyuki Asaki, Hironobu Niijima: CAD-Driven High-Precision E-Beam Positioning. ITC 1993: 928-935
1988
1		Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum: Electron Beam Tester Integrated into a VLSI Tester. ITC 1988: 908-913

Coauthor Index

1	Mitsuyuki Asaki	[2]
2	Péter Fazekas	[1]
3	Hans-Peter Feuerbaum	[1]
4	Arthur Hu	[2]
5	Toshinobu Kanai	[3]
6	Shouichi Koshizuka	[1]
7	Kent Kwang	[2]
8	Yasuji Oyama	[3]
9	Mathias Sturm	[1]
10	Yasuo Tokunaga	[1]
11	Hsin Wang	[2]
12	Kazuo Yakuwa	[1]

Colors in the list of coauthors