| |
| 1988 | ||
|---|---|---|
| 1 | Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum: Electron Beam Tester Integrated into a VLSI Tester. ITC 1988: 908-913 | |
| 1 | Péter Fazekas | [1] |
| 2 | Shouichi Koshizuka | [1] |
| 3 | Hironobu Niijima | [1] |
| 4 | Mathias Sturm | [1] |
| 5 | Yasuo Tokunaga | [1] |
| 6 | Kazuo Yakuwa | [1] |