Yasuji Oyama
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1996
1
Yasuji Oyama,
Toshinobu Kanai
,
Hironobu Niijima
: Scan Design Oriented Test Technique for VLSI's Using ATE.
ITC 1996
: 453-460
Coauthor
Index
1
Toshinobu Kanai
[
1
]
2
Hironobu Niijima
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
