2003 | ||
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3 | EE | F. Marc, B. Mongellaz, Y. Danto: Reliability simulation of electronic circuits with VHDL-AMS. FDL 2003: 175-184 |
2 | EE | B. Mongellaz, F. Marc, Y. Danto: Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectronics Reliability 43(9-11): 1513-1518 (2003) |
2002 | ||
1 | EE | B. Mongellaz, F. Marc, N. Milet-Lewis, Y. Danto: Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. Microelectronics Reliability 42(9-11): 1353-1358 (2002) |
1 | Y. Danto | [1] [2] [3] |
2 | F. Marc | [1] [2] [3] |
3 | N. Milet-Lewis | [1] |