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F. Marc

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2006
4EEC. Bestory, F. Marc, H. Levi, Y. Danto: Multi-level Modeling of Hot Carrier Injection for Reliability. FDL 2006: 61-68
2003
3EEF. Marc, B. Mongellaz, Y. Danto: Reliability simulation of electronic circuits with VHDL-AMS. FDL 2003: 175-184
2EEB. Mongellaz, F. Marc, Y. Danto: Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectronics Reliability 43(9-11): 1513-1518 (2003)
2002
1EEB. Mongellaz, F. Marc, N. Milet-Lewis, Y. Danto: Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. Microelectronics Reliability 42(9-11): 1353-1358 (2002)

Coauthor Index

1C. Bestory [4]
2Y. Danto [1] [2] [3] [4]
3H. Levi [4]
4N. Milet-Lewis [1]
5B. Mongellaz [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)