| 2006 |
|---|
| 4 | EE | C. Bestory,
F. Marc,
H. Levi,
Y. Danto:
Multi-level Modeling of Hot Carrier Injection for Reliability.
FDL 2006: 61-68 |
| 2003 |
|---|
| 3 | EE | F. Marc,
B. Mongellaz,
Y. Danto:
Reliability simulation of electronic circuits with VHDL-AMS.
FDL 2003: 175-184 |
| 2 | EE | B. Mongellaz,
F. Marc,
Y. Danto:
Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study.
Microelectronics Reliability 43(9-11): 1513-1518 (2003) |
| 2002 |
|---|
| 1 | EE | B. Mongellaz,
F. Marc,
N. Milet-Lewis,
Y. Danto:
Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language.
Microelectronics Reliability 42(9-11): 1353-1358 (2002) |
