| |
| 2007 | ||
|---|---|---|
| 5 | EE | Pekka Syri, Juha Häkkinen, Markku Moilanen: IEEE 1149.4 Compatible ABMs for Basic RF Measurements CoRR abs/0710.4721: (2007) |
| 4 | EE | Teuvo Saikkonen, Markku Moilanen: Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. J. Electronic Testing 23(6): 569-579 (2007) |
| 3 | EE | Jari Hannu, Markku Moilanen: Methods of Testing Discrete Semiconductors in the 1149.4 Environment. J. Electronic Testing 23(6): 581-592 (2007) |
| 2005 | ||
| 2 | EE | Pekka Syri, Juha Häkkinen, Markku Moilanen: EEE 1149.4 Compatible ABMs for Basic RF Measurements. DATE 2005: 172-173 |
| 2004 | ||
| 1 | EE | Juha Häkkinen, Pekka Syri, Juha-Veikko Voutilainen, Markku Moilanen: A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4. ITC 2004: 551-559 |
| 1 | Juha Häkkinen | [1] [2] [5] |
| 2 | Jari Hannu | [3] |
| 3 | Teuvo Saikkonen | [4] |
| 4 | Pekka Syri | [1] [2] [5] |
| 5 | Juha-Veikko Voutilainen | [1] |