Jari Hannu
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2007
1
EE
Jari Hannu,
Markku Moilanen
: Methods of Testing Discrete Semiconductors in the 1149.4 Environment.
J. Electronic Testing 23
(6): 581-592 (2007)
Coauthor
Index
1
Markku Moilanen
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
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ley@uni-trier.de
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