Teuvo Saikkonen

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2007

1 EE Teuvo Saikkonen, Markku Moilanen: Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. J. Electronic Testing 23(6): 569-579 (2007)

2007
1	EE	Teuvo Saikkonen, Markku Moilanen: Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. J. Electronic Testing 23(6): 569-579 (2007)

Coauthor Index

1 Markku Moilanen [1]