| |
| 1998 | ||
|---|---|---|
| 3 | EE | José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman: Test Reuse at System Level. VTS 1998: 318-319 |
| 1996 | ||
| 2 | Matthew Boutin, Peter Dziel: Application of Boundary Scan in a Fault Tolerant Computer System. ITC 1996: 809-817 | |
| 1 | Peter Dziel: The Need for Complete System Level Test Standardization. ITC 1996: 941 | |
| 1 | Saman Adham | [3] |
| 2 | Matthew Boutin | [2] |
| 3 | Scott Davidson | [3] |
| 4 | Steve Millman | [3] |
| 5 | José M. Miranda | [3] |