J. M. Mirabel

2002
3	EE	R. Laffont, J. Razafindramora, P. Canet, Rachid Bouchakour, J. M. Mirabel: Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact. MTDT 2002: 168-176
2001
2	EE	Rachid Bouchakour, N. Harabech, P. Canet, Ph. Boivin, J. M. Mirabel: Modeling of a floating-gate EEPROM cell using a charge sheet approach including variable tunneling capacitance and polysilicon gate depletion effect. ISCAS (4) 2001: 822-825
1	EE	P. Canet, Rachid Bouchakour, N. Harabech, Ph. Boivin, J. M. Mirabel: EEPROM programming study-time and degradation aspects. ISCAS (4) 2001: 846-849

Coauthor Index

1	Ph. Boivin	[1] [2]
2	Rachid Bouchakour	[1] [2] [3]
3	P. Canet	[1] [2] [3]
4	N. Harabech	[1] [2]
5	R. Laffont	[3]
6	J. Razafindramora	[3]