| |
| 2002 | ||
|---|---|---|
| 1 | EE | R. Laffont, J. Razafindramora, P. Canet, Rachid Bouchakour, J. M. Mirabel: Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact. MTDT 2002: 168-176 |
| 1 | Rachid Bouchakour | [1] |
| 2 | P. Canet | [1] |
| 3 | R. Laffont | [1] |
| 4 | J. M. Mirabel | [1] |