S. Meli

2003
1	EE	M. Porti, S. Meli, M. Nafría, X. Aymerich: Pre-breakdown noise in electrically stressed thin SiO2 layers of MOS devices observed with C-AFM. Microelectronics Reliability 43(8): 1203-1209 (2003)

Coauthor Index

1	X. Aymerich	[1]
2	M. Nafría	[1]
3	M. Porti	[1]