| 2006 |
|---|
| 3 | EE | B. Saillet,
A. Regnier,
Jean Michel Portal,
B. Delsuc,
R. Laffont,
Pascal Masson,
Rachid Bouchakour:
MM11 based flash memory cell model including characterization procedure.
ISCAS 2006 |
| 2005 |
|---|
| 2 | EE | Fabien Gilibert,
Denis Rideau,
Alexandre Dray,
Francois Agut,
Michel Minondo,
Andre Juge,
Pascal Masson,
Rachid Bouchakour:
Characterization and Modeling of Gate-Induced-Drain-Leakage.
IEICE Transactions 88-C(5): 829-837 (2005) |
| 2004 |
|---|
| 1 | EE | S. Bernardini,
Jean Michel Portal,
Pascal Masson:
A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology.
DATE 2004: 1404-1405 |
