S. Bernardini
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2004
1
EE
S. Bernardini,
Jean Michel Portal
,
Pascal Masson
: A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology.
DATE 2004
: 1404-1405
Coauthor
Index
1
Pascal Masson
[
1
]
2
Jean Michel Portal
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
