2005 | ||
---|---|---|
2 | EE | Robert F. Enenkel, Blake G. Fitch, Robert S. Germain, Fred G. Gustavson, A. Martin, Mark P. Mendell, Jed W. Pitera, Michael Pitman, Aleksandr Rayshubskiy, Frank Suits, William C. Swope, T. J. Christopher Ward: Custom math functions for molecular dynamics. IBM Journal of Research and Development 49(2-3): 465-474 (2005) |
2001 | ||
1 | EE | B. Lanchava, P. Baumgartner, A. Martin, A. Beyer, E. Mueller: Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation. Microelectronics Reliability 41(7): 1097-1100 (2001) |
1 | P. Baumgartner | [1] |
2 | A. Beyer | [1] |
3 | Robert F. Enenkel | [2] |
4 | Blake G. Fitch | [2] |
5 | Robert S. Germain | [2] |
6 | Fred G. Gustavson | [2] |
7 | B. Lanchava | [1] |
8 | Mark P. Mendell | [2] |
9 | E. Mueller | [1] |
10 | Jed W. Pitera | [2] |
11 | Michael Pitman | [2] |
12 | Aleksandr Rayshubskiy | [2] |
13 | Frank Suits | [2] |
14 | William C. Swope | [2] |
15 | T. J. Christopher Ward | [2] |