| |
| 2005 | ||
|---|---|---|
| 2 | EE | A. Beyer, T. Wilhelm: Dynamic simulation of protein complex formation on a genomic scale. Bioinformatics 21(8): 1610-1616 (2005) |
| 2001 | ||
| 1 | EE | B. Lanchava, P. Baumgartner, A. Martin, A. Beyer, E. Mueller: Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation. Microelectronics Reliability 41(7): 1097-1100 (2001) |
| 1 | P. Baumgartner | [1] |
| 2 | B. Lanchava | [1] |
| 3 | A. Martin | [1] |
| 4 | E. Mueller | [1] |
| 5 | T. Wilhelm | [2] |