| |
| 2004 | ||
|---|---|---|
| 2 | EE | William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz: The Leading Edge of Production Wafer Probe Test Technology. ITC 2004: 1168-1195 |
| 1989 | ||
| 1 | William R. Mann: R96MFX Test Strategy. ITC 1989: 611-614 | |
| 1 | Jerry J. Broz | [2] |
| 2 | Philip W. Seitzer | [2] |
| 3 | Frederick L. Taber | [2] |