| |
| 2004 | ||
|---|---|---|
| 2 | EE | William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz: The Leading Edge of Production Wafer Probe Test Technology. ITC 2004: 1168-1195 |
| 1998 | ||
| 1 | EE | Frederick L. Taber: An introduction to area array probing. ITC 1998: 277-281 |
| 1 | Jerry J. Broz | [2] |
| 2 | William R. Mann | [2] |
| 3 | Philip W. Seitzer | [2] |