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2001 | ||
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2 | EE | S. Voldman, W. Anderson, R. Ashton, M. Chaine, C. Duvvury, T. Maloney, E. Worley: A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectronics Reliability 41(3): 335-348 (2001) |
1984 | ||
1 | T. Maloney: Active Matrix Addressed Liquid Crystal Displays. COMPCON 1984: 396- |
1 | W. Anderson | [2] |
2 | R. Ashton | [2] |
3 | M. Chaine | [2] |
4 | C. Duvvury | [2] |
5 | S. Voldman | [2] |
6 | E. Worley | [2] |