| |
| 2001 | ||
|---|---|---|
| 1 | EE | S. Voldman, W. Anderson, R. Ashton, M. Chaine, C. Duvvury, T. Maloney, E. Worley: A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectronics Reliability 41(3): 335-348 (2001) |
| 1 | W. Anderson | [1] |
| 2 | M. Chaine | [1] |
| 3 | C. Duvvury | [1] |
| 4 | T. Maloney | [1] |
| 5 | S. Voldman | [1] |
| 6 | E. Worley | [1] |