C. Duvvury

2005
2	EE	G. Boselli, C. Duvvury: Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies. Microelectronics Reliability 45(9-11): 1406-1414 (2005)
2001
1	EE	S. Voldman, W. Anderson, R. Ashton, M. Chaine, C. Duvvury, T. Maloney, E. Worley: A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectronics Reliability 41(3): 335-348 (2001)

Coauthor Index

1	W. Anderson	[1]
2	R. Ashton	[1]
3	G. Boselli	[2]
4	M. Chaine	[1]
5	T. Maloney	[1]
6	S. Voldman	[1]
7	E. Worley	[1]

Colors in the list of coauthors