Mark Malinoski

2001
2		Mark Malinoski, Burnell G. West: Rapid-response temperature control provides new defect screening opportunities. ITC 2001: 903-907
1998
1	EE	Mark Malinoski, James Maveety, Steve Knostman, Tom Jones: A test site thermal control system for at-speed manufacturing testing. ITC 1998: 119-

Coauthor Index

1	Tom Jones	[1]
2	Steve Knostman	[1]
3	James Maveety	[1]
4	Burnell G. West	[2]

Colors in the list of coauthors