Steve Knostman
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1998
1
EE
Mark Malinoski
,
James Maveety
, Steve Knostman,
Tom Jones
: A test site thermal control system for at-speed manufacturing testing.
ITC 1998
: 119-
Coauthor
Index
1
Tom Jones
[
1
]
2
Mark Malinoski
[
1
]
3
James Maveety
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)