James Maveety

2002
2	EE	Chia-Pin Chiu, James Maveety, Quan A. Tran: Characterization of solder interfaces using laser flash metrology. Microelectronics Reliability 42(1): 93-100 (2002)
1998
1	EE	Mark Malinoski, James Maveety, Steve Knostman, Tom Jones: A test site thermal control system for at-speed manufacturing testing. ITC 1998: 119-

Coauthor Index

1	Chia-Pin Chiu	[2]
2	Tom Jones	[1]
3	Steve Knostman	[1]
4	Mark Malinoski	[1]
5	Quan A. Tran	[2]

Colors in the list of coauthors