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P. Majhi

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2006
1EES. Chatterjee, Yue Kuo, J. Lu, J.-Y. Tewg, P. Majhi: Electrical reliability aspects of HfO2 high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress. Microelectronics Reliability 46(1): 69-76 (2006)

Coauthor Index

1S. Chatterjee [1]
2Yue Kuo [1]
3J. Lu [1]
4J.-Y. Tewg [1]

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