2006 |
6 | EE | S. Chatterjee,
Yue Kuo,
J. Lu,
J.-Y. Tewg,
P. Majhi:
Electrical reliability aspects of HfO2 high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress.
Microelectronics Reliability 46(1): 69-76 (2006) |
2004 |
5 | | Hamid R. Arabnia,
Olaf Droegehorn,
S. Chatterjee:
Proceedings of the International Conference on Internet Computing, IC '04, Volume 2 & Proceedings of the International Symposium on Web Services & Applications, ISWS '04, Las Vegas, Nevada, USA, June 21-24, 2004
CSREA Press 2004 |
4 | EE | S. Chatterjee,
R. B. Misra,
S. S. Alam:
N-version programming with imperfect debugging.
Computers & Electrical Engineering 30(6): 453-463 (2004) |
1999 |
3 | EE | S. Chatterjee:
TCP behavior over HFC cable modem access networks.
Computer Communications 22(14): 1321-1332 (1999) |
1997 |
2 | EE | S. Chatterjee,
R. B. Misra,
S. S. Alam:
Prediction of software reliability using an auto regressive process.
Int. J. Systems Science 28(2): 211-216 (1997) |
1 | EE | S. Chatterjee,
R. B. Misra,
S. S. Alam:
Joint effect of test effort and learning factor on software reliability and optimal release policy.
Int. J. Systems Science 28(4): 391-396 (1997) |