| |
| 2005 | ||
|---|---|---|
| 1 | EE | Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press: Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium 2005: 312-317 |
| 1 | Wu-Tung Cheng | [1] |
| 2 | Jay Jahangiri | [1] |
| 3 | Nilanjan Mukherjee | [1] |
| 4 | Ron Press | [1] |