2006 | ||
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4 | EE | Ching-Yang Chen, Yung-Ching Chao, De-Shin Liu, Zhen-Wei Zhuang: Design of a novel chip on glass package solution for CMOS image sensor device. Microelectronics Reliability 46(8): 1326-1334 (2006) |
2002 | ||
3 | EE | De-Shin Liu, Chin-Yu Ni: The optimization design of bump interconnections in flip chip packages from the electrical standpoint. Microelectronics Reliability 42(12): 1893-1901 (2002) |
2 | EE | Chin-Yu Ni, De-Shin Liu, Ching-Yang Chen: Procedure for design optimization of a T-cap flip chip package. Microelectronics Reliability 42(12): 1903-1911 (2002) |
1 | EE | De-Shin Liu, Chin-Yu Ni: A thermo-mechanical study on the electrical resistance of aluminum wire conductors. Microelectronics Reliability 42(3): 367-374 (2002) |
1 | Yung-Ching Chao | [4] |
2 | Ching-Yang Chen | [2] [4] |
3 | Chin-Yu Ni | [1] [2] [3] |
4 | Zhen-Wei Zhuang | [4] |