| |
| 1999 | ||
|---|---|---|
| 3 | Kyung Tek Lee, Jacob A. Abraham: Critical path identification and delay tests of dynamic circuits. ITC 1999: 421-430 | |
| 1998 | ||
| 2 | EE | Kyung Tek Lee, Clay Nordquist, Jacob A. Abraham: Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits. VTS 1998: 34-41 |
| 1997 | ||
| 1 | EE | Rathish Jayabharathi, Kyung Tek Lee, Jacob A. Abraham: A Novel Solution for Chip-Level Functional Timing Verification. VTS 1997: 137-142 |
| 1 | Jacob A. Abraham | [1] [2] [3] |
| 2 | Rathish Jayabharathi | [1] |
| 3 | Clay Nordquist | [2] |