Clay Nordquist
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1998
1
EE
Kyung Tek Lee
, Clay Nordquist,
Jacob A. Abraham
: Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits.
VTS 1998
: 34-41
Coauthor
Index
1
Jacob A. Abraham
[
1
]
2
Kyung Tek Lee
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
