| |
| 2004 | ||
|---|---|---|
| 3 | EE | Olivier Duval, L.-P. Lafrance, Yvon Savaria, Pierre Desjardins: An Integrated Test Platform for Nanostructure Electrical Characterization. ICMENS 2004: 237-242 |
| 2 | EE | L.-P. Lafrance, Yvon Savaria: A Framework for Implementing Reusable Digital Signal Processing Modules. IWSOC 2004: 51-54 |
| 2002 | ||
| 1 | EE | L.-P. Lafrance, Marc-André Cantin, Yvon Savaria, S. H. Sung, Pierre Lavoie: Architecture and performance characterization of hardware and software implementations of the Crozier frequency estimation algorithm. ISCAS (4) 2002: 823-826 |
| 1 | Marc-André Cantin | [1] |
| 2 | Pierre Desjardins | [3] |
| 3 | Olivier Duval | [3] |
| 4 | Pierre Lavoie | [1] |
| 5 | Yvon Savaria | [1] [2] [3] |
| 6 | S. H. Sung | [1] |