| |
| 2004 | ||
|---|---|---|
| 2 | EE | Olivier Duval, L.-P. Lafrance, Yvon Savaria, Pierre Desjardins: An Integrated Test Platform for Nanostructure Electrical Characterization. ICMENS 2004: 237-242 |
| 1 | Olivier Duval, Yvon Savaria: An on-chip delay measurements module for nanostructures characterization. ISCAS (3) 2004: 721-724 | |
| 1 | Pierre Desjardins | [2] |
| 2 | L.-P. Lafrance | [2] |
| 3 | Yvon Savaria | [1] [2] |