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Olivier Duval

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2004
2EEOlivier Duval, L.-P. Lafrance, Yvon Savaria, Pierre Desjardins: An Integrated Test Platform for Nanostructure Electrical Characterization. ICMENS 2004: 237-242
1 Olivier Duval, Yvon Savaria: An on-chip delay measurements module for nanostructures characterization. ISCAS (3) 2004: 721-724

Coauthor Index

1Pierre Desjardins [2]
2L.-P. Lafrance [2]
3Yvon Savaria [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)