| |
| 2004 | ||
|---|---|---|
| 3 | EE | Olivier Duval, L.-P. Lafrance, Yvon Savaria, Pierre Desjardins: An Integrated Test Platform for Nanostructure Electrical Characterization. ICMENS 2004: 237-242 |
| 1974 | ||
| 2 | Olivier Lecarme, Pierre Desjardins: More Comments on the Programming Language Pascal Acta Inf. 4: 231-243 (1974) | |
| 1 | Pierre Desjardins: Dynamic Data Structure Mapping. Softw., Pract. Exper. 4(2): 155-162 (1974) | |
| 1 | Olivier Duval | [3] |
| 2 | L.-P. Lafrance | [3] |
| 3 | Olivier Lecarme | [2] |
| 4 | Yvon Savaria | [3] |