| 2006 |
|---|
| 4 | EE | Narendra Devta-Prasanna,
Arun Gunda,
P. Krishnamurthy,
Sudhakar M. Reddy,
Irith Pomeranz:
Test Generation for Open Defects in CMOS Circuits.
DFT 2006: 41-49 |
| 3 | EE | Narendra Devta-Prasanna,
Arun Gunda,
P. Krishnamurthy,
Sudhakar M. Reddy,
Irith Pomeranz:
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults.
European Test Symposium 2006: 185-192 |
| 2005 |
|---|
| 2 | EE | Narendra Devta-Prasanna,
Sudhakar M. Reddy,
Arun Gunda,
P. Krishnamurthy,
Irith Pomeranz:
Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.
Asian Test Symposium 2005: 202-207 |
| 1 | EE | Narendra Devta-Prasanna,
Arun Gunda,
P. Krishnamurthy,
Sudhakar M. Reddy,
Irith Pomeranz:
A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals.
ICCD 2005: 471-474 |
