Aman Kokrady

2008
4	EE	Aman Kokrady, C. P. Ravikumar, Nitin Chandrachoodan: Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models. VLSI Design 2008: 169-174
2006
3	EE	Aman Kokrady, Theo J. Powell, S. Ramakrishnan: Reducing Design Verification Cycle Time through Testbench Redundancy. VLSI Design 2006: 243-248
2004
2	EE	Aman Kokrady, C. P. Ravikumar: Fast, Layout-Aware Validation of Test-Vectors for Nanometer-Related Timing Failures. VLSI Design 2004: 597-
2003
1	EE	Aman Kokrady, C. P. Ravikumar: Static Verification of Test Vectors for IR Drop Failure. ICCAD 2003: 760-764

Coauthor Index

1	Nitin Chandrachoodan	[4]
2	Theo J. Powell	[3]
3	S. Ramakrishnan	[3]
4	C. P. Ravikumar	[1] [2] [4]

Colors in the list of coauthors