| |
| 2008 | ||
|---|---|---|
| 2 | EE | Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang: Degradation Analysis of Nano-Contamination in Plasma Display Panels. IEEE Transactions on Reliability 57(2): 222-229 (2008) |
| 2004 | ||
| 1 | EE | Deok-Soo Kim, Cheol-Hyung Cho, Youngsong Cho, Chang Wook Kang, Hyun-Chan Lee, Joon Young Park: Probability Distribution of Op-Codes in Edgebreaker. ICCSA (2) 2004: 554-563 |
| 1 | Suk Joo Bae | [2] |
| 2 | Cheol-Hyung Cho | [1] |
| 3 | Youngsong Cho | [1] |
| 4 | Deok-Soo Kim | [1] |
| 5 | Man Soo Kim | [2] |
| 6 | Seong-Joon Kim | [2] |
| 7 | Bae Jin Lee | [2] |
| 8 | Hyun-Chan Lee | [1] |
| 9 | Joon Young Park | [1] |