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2008 | ||
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2 | EE | Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang: Degradation Analysis of Nano-Contamination in Plasma Display Panels. IEEE Transactions on Reliability 57(2): 222-229 (2008) |
2004 | ||
1 | EE | Deok-Soo Kim, Cheol-Hyung Cho, Youngsong Cho, Chang Wook Kang, Hyun-Chan Lee, Joon Young Park: Probability Distribution of Op-Codes in Edgebreaker. ICCSA (2) 2004: 554-563 |
1 | Suk Joo Bae | [2] |
2 | Cheol-Hyung Cho | [1] |
3 | Youngsong Cho | [1] |
4 | Deok-Soo Kim | [1] |
5 | Man Soo Kim | [2] |
6 | Seong-Joon Kim | [2] |
7 | Bae Jin Lee | [2] |
8 | Hyun-Chan Lee | [1] |
9 | Joon Young Park | [1] |