| |
| 2003 | ||
|---|---|---|
| 3 | EE | Kinam Kim, Yoon J. Song: Integration technology for ferroelectric memory devices. Microelectronics Reliability 43(3): 385-398 (2003) |
| 2002 | ||
| 2 | EE | Yongseok Ahn, Sanghyun Lee, Gwanhyeob Koh, Taeyoung Chung, Kinam Kim: The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon. Microelectronics Reliability 42(3): 349-354 (2002) |
| 1 | EE | Kinam Kim, Gi-Tae Jeong, Chan-Woong Chun, Sam-Jin Hwang: DRAM reliability. Microelectronics Reliability 42(4-5): 543-553 (2002) |
| 1 | Yongseok Ahn | [2] |
| 2 | Chan-Woong Chun | [1] |
| 3 | Taeyoung Chung | [2] |
| 4 | Sam-Jin Hwang | [1] |
| 5 | Gi-Tae Jeong | [1] |
| 6 | Gwanhyeob Koh | [2] |
| 7 | Sanghyun Lee | [2] |
| 8 | Yoon J. Song | [3] |