Chan-Woong Chun
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2002
1
EE
Kinam Kim
,
Gi-Tae Jeong
, Chan-Woong Chun,
Sam-Jin Hwang
: DRAM reliability.
Microelectronics Reliability 42
(4-5): 543-553 (2002)
Coauthor
Index
1
Sam-Jin Hwang
[
1
]
2
Gi-Tae Jeong
[
1
]
3
Kinam Kim
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
