Heon C. Kim

2004
2	EE	Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung: At-Speed Interconnect Test and Diagnosis of External Memories on a System. ITC 2004: 156-162
2002
1	EE	Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung: Re-Using DFT Logic for Functional and Silicon Debugging Test. ITC 2002: 648-656

Coauthor Index

1	Sung Soo Chung	[1] [2]
2	Xinli Gu	[1] [2]
3	Hong Shin Jun	[2]
4	Kevin Li	[1]
5	Weili Wang	[1]