Hong Shin Jun

2004
4	EE	Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung: At-Speed Interconnect Test and Diagnosis of External Memories on a System. ITC 2004: 156-162
3	EE	Hong Shin Jun, Sung Soo Chung, Sang H. Baeg: Removing JTAG Bottlenecks in System Interconnect Test. ITC 2004: 173-180
1996
2	EE	Hong Shin Jun, Sun Young Hwang: Automatic synthesis of dynamically configured pipelines supporting variable data initiation intervals. IEEE Trans. VLSI Syst. 4(2): 279-285 (1996)
1994
1	EE	Hong Shin Jun, Sun Young Hwang: Automatic Synthesis of Pipeline Structures with Variable Data Initiation Intervals. DAC 1994: 537-541

Coauthor Index

1	Sang H. Baeg	[3]
2	Sung Soo Chung	[3] [4]
3	Xinli Gu	[4]
4	Sun Young Hwang	[1] [2]
5	Heon C. Kim	[4]

Colors in the list of coauthors