| |
| 2001 | ||
|---|---|---|
| 1 | EE | Gunnar Diestel, Andreas Martin, Martin Kerber, Alfred Schlemm, Horst Erlenmaier, Bernhard Murr, Andreas Preussger: Quality assessment of thin oxides using constant and ramped stress measurements. Microelectronics Reliability 41(7): 1019-1022 (2001) |
| 1 | Gunnar Diestel | [1] |
| 2 | Martin Kerber | [1] |
| 3 | Andreas Martin | [1] |
| 4 | Bernhard Murr | [1] |
| 5 | Andreas Preussger | [1] |
| 6 | Alfred Schlemm | [1] |