| |
| 2005 | ||
|---|---|---|
| 1 | EE | Jong Hun Kim, Kyosun Kim, Seok Hee Jeon, Jong-Tae Park: Reliability improvement by the suppression of keyhole generation in W-plug vias. Microelectronics Reliability 45(9-11): 1455-1458 (2005) |
| 1 | Seok Hee Jeon | [1] |
| 2 | Kyosun Kim | [1] |
| 3 | Jong-Tae Park | [1] |