2007 | ||
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2 | Jiri Jenícek, Ondrej Novák: Test Pattern Compression Based on Pattern Overlapping. DDECS 2007: 29-34 | |
2006 | ||
1 | EE | Ondrej Novák, Zdenek Plíva, Jiri Jenícek, Zbynek Mader, Michal Jarkovský: Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead. DFT 2006: 300-308 |
1 | Michal Jarkovský | [1] |
2 | Zbynek Mader | [1] |
3 | Ondrej Novák | [1] [2] |
4 | Zdenek Plíva | [1] |