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| 2003 | ||
|---|---|---|
| 5 | EE | Aditya Kapoor, Kush Arora, Ajai Jain, G. P. Kapoor: Stochastic Image Compression Using Fractals. ITCC 2003: 574- |
| 1998 | ||
| 4 | EE | V. Rajesh, Ajai Jain: Automatic Test Pattern Generation for Sequential Circuits Using Genetic Algorithms. VLSI Design 1998: 270-273 |
| 3 | EE | Amey Karkare, Manoj Singla, Ajai Jain: Testability Preserving and Enhancing Transformations for Robust Delay Fault Testabilit. VLSI Design 1998: 370-373 |
| 1996 | ||
| 2 | EE | Dhruva R. Chakrabarti, Ajai Jain: An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits. VLSI Design 1996: 174-177 |
| 1995 | ||
| 1 | EE | Dhruva R. Chakrabarti, Ajai Jain: An improved hierarchical test generation technique for combinational circuits with repetitive sub-circuits. Asian Test Symposium 1995: 237-243 |
| 1 | Kush Arora | [5] |
| 2 | Dhruva R. Chakrabarti | [1] [2] |
| 3 | Aditya Kapoor | [5] |
| 4 | G. P. Kapoor | [5] |
| 5 | Amey Karkare | [3] |
| 6 | V. Rajesh | [4] |
| 7 | Manoj Singla | [3] |