2003 | ||
---|---|---|
5 | EE | Aditya Kapoor, Kush Arora, Ajai Jain, G. P. Kapoor: Stochastic Image Compression Using Fractals. ITCC 2003: 574- |
1998 | ||
4 | EE | V. Rajesh, Ajai Jain: Automatic Test Pattern Generation for Sequential Circuits Using Genetic Algorithms. VLSI Design 1998: 270-273 |
3 | EE | Amey Karkare, Manoj Singla, Ajai Jain: Testability Preserving and Enhancing Transformations for Robust Delay Fault Testabilit. VLSI Design 1998: 370-373 |
1996 | ||
2 | EE | Dhruva R. Chakrabarti, Ajai Jain: An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits. VLSI Design 1996: 174-177 |
1995 | ||
1 | EE | Dhruva R. Chakrabarti, Ajai Jain: An improved hierarchical test generation technique for combinational circuits with repetitive sub-circuits. Asian Test Symposium 1995: 237-243 |
1 | Kush Arora | [5] |
2 | Dhruva R. Chakrabarti | [1] [2] |
3 | Aditya Kapoor | [5] |
4 | G. P. Kapoor | [5] |
5 | Amey Karkare | [3] |
6 | V. Rajesh | [4] |
7 | Manoj Singla | [3] |